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Active standard | Published: 25/09/2012
IEC 60749-27-ed.2.0/Amd.1 Change
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
(Amendement 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 27: Essai de sensibilite aux decharges electrostatiques (DES) - Modele de machine (MM))
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Available design: electronic design (pdf), Print design, CD-ROM
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Detail information
Designation: IEC 60749-27-ed.2.0/Amd.1
Publication date: 25/09/2012
Pages: 5
Note: Change
Country: International technical standard
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