Active standard | Published: 22/10/2025

IEC 61189-3-302-ed.1.0

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3-302: Detection of plating defects in unpopulated circuit boards by computed tomography (CT)
(Methodes d’essai pour les materiaux electriques, les cartes imprimees et autres structures d’interconnexion et ensembles – Partie 3-302: Detection des defauts de metallisation dans les cartes de circuits imprimes nus par tomographie informatisee (TI))

Available languages: English, French, English and French

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Detail information

Designation: IEC 61189-3-302-ed.1.0

Publication date: 22/10/2025

Pages: 17

Country: International technical standard

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Anotation

IEC 61189-3-302:2025 describes a method for the detection of plating defects in unpopulated circuit boards using computed tomography (CT). This document is applicable to non-destructive testing of metallized holes. L’IEC 61189-3-302:2025 decrit la methode de detection des defauts de metallisation des cartes de circuits imprimes nus par tomographie informatisee (TI). Le present document s’applique aux essais non destructifs des trous metallises.

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