Active standard | Published: 19/01/2023

IEC 62951-8-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

Available languages: English

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Detail information

Designation: IEC 62951-8-ed.1.0

Publication date: 19/01/2023

Pages: 14

Country: International technical standard

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Anotation

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.

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