Aktivní norma | Vydána: 19.01.2023

IEC 62951-8-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

Dostupné jazyky: Anglicky

Dostupné provedení: Elektronické PDF, Tištěné, CD-ROM

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Podrobné informace

Označení: IEC 62951-8-ed.1.0

Datum vydání: 19.01.2023

Stran: 14

Země: Mezinárodní technická norma

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Anotace

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.

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