Active standard | Published: 29/03/2023

IEC 63287-2-ed.1.0

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
(Dispositifs a semiconducteurs - Lignes directrices concernant les plans de qualification de la fiabilite - Partie 2: Concept de profil de mission)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

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Detail information

Designation: IEC 63287-2-ed.1.0

Publication date: 29/03/2023

Pages: 30

Country: International technical standard

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Anotation

IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications. L’IEC 63287-2:2023 fournit des lignes directrices pour lelaboration de plans de qualification de la fiabilite a l’aide du concept de profil de mission, sur la base des conditions environnementales et de l’utilisation prevue du produit. Le present document n’est pas destine aux applications militaires et spatiales.

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