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Withdrawn | Published: 29/04/2004
IEEE 1620-2004 Withdrawn
Standard for Test Methods for the Characterization of Organic Transistors and Materials
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 134.10 EUR
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Detail information
Designation: IEEE 1620-2004
Publication date: 29/04/2004
Pages: 0
Note: Withdrawn
Country: International technical standard
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