Active standard | Published: 31/10/2019

IEEE C62.59-2019

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

Available languages: English

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Detail information

Designation: IEEE C62.59-2019

Publication date: 31/10/2019

Pages: 41

Country: International technical standard

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Anotation

New IEEE Standard - Active.
Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators.

ISBN: 978-1-5044-6119-1, 978-1-5044-6120-7
Number of Pages: 41
Product Code: STD23860, STDPD23860
Keywords: avalanche breakdown, electrical characteristics, electrical ratings, foldback, forward conduction, IEEE C62.59, overvoltage protection, punch-through, surge protective component (SPC), test methods, Zener breakdown
Category: Surge-Protective Devices

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