Aktivní norma | Vydána: 31.10.2019

IEEE C62.59-2019

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

Dostupné jazyky: Anglicky

Dostupné provedení: Zabezpečené PDF - okamžité stažení, Tištěné

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Podrobné informace

Označení: IEEE C62.59-2019

Datum vydání: 31.10.2019

Stran: 41

Země: Mezinárodní technická norma

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Anotace

New IEEE Standard - Active.
Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators.

ISBN: 978-1-5044-6119-1, 978-1-5044-6120-7
Number of Pages: 41
Product Code: STD23860, STDPD23860
Keywords: avalanche breakdown, electrical characteristics, electrical ratings, foldback, forward conduction, IEEE C62.59, overvoltage protection, punch-through, surge protective component (SPC), test methods, Zener breakdown
Category: Surge-Protective Devices

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