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Active standard | Published: 28/02/2024
ISO 18118:2024-ed.3.0
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
(Analyse chimique des surfaces — Spectroscopie des électrons Auger et spectroscopie de photoélectrons — Lignes directrices pour l´utilisation de facteurs expérimentaux de sensibilité relative pour l´analyse quantitative de matériaux homogenes)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: ISO 18118:2024-ed.3.0
Publication date: 28/02/2024
Pages: 22
Country: International technical standard
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Description / Abstract: This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.Popular Publishers
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