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Active standard | Published: 22/12/2014
JIS C5630-18:2014
Semiconductor devices -- Micro-electromechanical devices -- Part 18: Bend testing methods of thin film materials
Available languages: Japanese
Available design: electronic design (pdf), Print design
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Detail information
Designation: JIS C5630-18:2014
Publication date: 22/12/2014
Pages: 12
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