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Active standard | Published: 22/08/2011
JIS C5630-6:2011
Semiconductor devices -- Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials
Available languages: Japanese
Available design: electronic design (pdf), Print design
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Detail information
Designation: JIS C5630-6:2011
Publication date: 22/08/2011
Pages: 12
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