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Active standard | Published: 28/02/1994
JIS H0611:1994
Methods of measurement of thickness, thickness variation and bow for silicon wafer
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 1 519.90 USD
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Detail information
Designation: JIS H0611:1994
Publication date: 28/02/1994
Pages: 6
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You can buy at www.mystandards.bizPopular Publishers
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