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Active standard | Published: 21/03/2024
JIS H0616:2024
Test method for low substitutional atomic carbon content of single crystal silicon by Fourier transform infrared absorption spectroscopy at room temperature
Available languages: Japanese
Available design: electronic design (pdf), Print design
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Detail information
Designation: JIS H0616:2024
Publication date: 21/03/2024
Pages: 24
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