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Active standard | Published: 30/04/2002
JIS K0146:2002
Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 3 000.00 EUR
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Detail information
Designation: JIS K0146:2002
Publication date: 30/04/2002
Pages: 20
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You can buy at www.mystandards.bizPopular Publishers
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