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Active standard | Published: 20/04/2010
JIS K0190:2010
Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 2 600.00 EUR
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Detail information
Designation: JIS K0190:2010
Publication date: 20/04/2010
Pages: 12
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You can buy at www.mystandards.bizPopular Publishers
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