Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Active standard | Published: 01/12/2015
STN EN 62047-16
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films ÔÇô Wafer curvature and cantilever beam deflection methods
Available languages: English
Available design: Print design
Detail information
Designation: STN EN 62047-16
Publication date: 01/12/2015
Pages: 0
Country: Slovak technical standard
Where to buy?
You can buy at www.mystandards.bizPopular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
