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Withdrawn | Published: 01/01/2016
UNE-EN 15991:2011 Withdrawn
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in March of 2011.)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: UNE-EN 15991:2011
Publication date: 01/01/2016
Pages: 29
Note: Withdrawn
Country: Spanish technical standard
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