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Active standard | Published: 19/01/2011
UNE-EN 60749-19:2003/A1:2011 Change
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 35.20 USD
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Detail information
Designation: UNE-EN 60749-19:2003/A1:2011
Publication date: 19/01/2011
Pages: 12
Note: Change
Country: Spanish technical standard
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