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Active standard | Published: 30/05/2003
UNE-EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 40.20 EUR
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Detail information
Designation: UNE-EN 60749-2:2003
Publication date: 30/05/2003
Pages: 19
Country: Spanish technical standard
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