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Active standard | Published: 01/01/2013
UNE-EN 60749-27:2006/A1:2012 Change
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
Available languages: English
Available design: electronic design (pdf), Print design
from 19.80 USD
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Detail information
Designation: UNE-EN 60749-27:2006/A1:2012
Publication date: 01/01/2013
Pages: 11
Note: Change
Country: Spanish technical standard
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