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Active standard | Published: 01/11/2006
UNE-EN 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)
Available languages: English
Available design: electronic design (pdf), Print design
from 57.80 EUR
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Detail information
Designation: UNE-EN 60749-27:2006
Publication date: 01/11/2006
Pages: 17
Country: Spanish technical standard
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