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Active standard | Published: 01/01/2007
UNE-EN 60749-35:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: UNE-EN 60749-35:2006
Publication date: 01/01/2007
Pages: 25
Country: Spanish technical standard
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