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Active standard | Published: 01/09/2008
UNE-EN 60749-38:2008
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: UNE-EN 60749-38:2008
Publication date: 01/09/2008
Pages: 16
Country: Spanish technical standard
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