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Active standard | Published: 01/12/2016
UNE-EN 60749-44:2016
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
Available languages: English
Available design: electronic design (pdf), Print design
from 1 653.80 CZK
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Detail information
Designation: UNE-EN 60749-44:2016
Publication date: 01/12/2016
Pages: 28
Country: Spanish technical standard
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