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Active standard | Published: 01/06/2010
UNE-EN 62047-6:2010
Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (Endorsed by AENOR in June of 2010.)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: UNE-EN 62047-6:2010
Publication date: 01/06/2010
Pages: 19
Country: Spanish technical standard
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