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Active standard | Published: 01/10/2010
UNE-EN 62418:2010
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Available languages: English
Available design: electronic design (pdf), Print design
from 1 549.50 CZK
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Detail information
Designation: UNE-EN 62418:2010
Publication date: 01/10/2010
Pages: 20
Country: Spanish technical standard
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