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Active standard | Published: 01/05/2022
UNE-EN IEC 60749-28:2022
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Espanola de Normalización in May of 2022.)
Available languages: English
Available design: electronic design (pdf), Print design
from 100.00 EUR
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Detail information
Designation: UNE-EN IEC 60749-28:2022
Publication date: 01/05/2022
Pages: 57
Country: Spanish technical standard
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