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Active standard | Published: 01/01/2023
UNE-EN IEC 60749-37:2022
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Espanola de Normalización in January of 2023.)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: UNE-EN IEC 60749-37:2022
Publication date: 01/01/2023
Pages: 29
Country: Spanish technical standard
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