ASTM E1127-08 Neplatná

Podrobné informace

Označení: ASTM E1127-08

Datum vydání: 01.10.2008

Stran: 5

Poznámka: Neplatná

Země: Americká technická norma

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Můžete zakoupit na eshop.normservis.cz

Anotace

Keywords:
angle lapping, angle-resolved AES, Auger electron spectroscopy, ball cratering, compositional depth profiling, cross sectioning, depth profiling, depth resolution, sputter depth profiling, sputtering, thin films, Surface analysis--spectrochemical analysis, Angle lapping and staining technique, Argon atmospheres, Auger electron spectroscopy (AES), Ball cratering, Crater edge profiling, Depth profiling, Gases, Ion sputtering, Noble gas ions, Nondestructive evaluation (NDE), Polishing properties