ISO 24688:2022

Detailinformationen

Bezeichnung: ISO 24688:2022

Ausgabedatum: 22.07.2022

Seiten: 8

Land: Internationale technische Norm

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Annotation

Description / Abstract: This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).