Active standard | Published: 22/07/2022

ISO 24688:2022

Determination of modulation period of nano-multilayer coatings by low-angle X-ray methods
(Titre manque)

Available languages: English

Available design: electronic design (pdf), Print design

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Detail information

Designation: ISO 24688:2022

Publication date: 22/07/2022

Pages: 8

Country: International technical standard

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Anotation

Description / Abstract: This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).

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