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ASTM - American technical standards
Page 8102
ASTM F1262M-95(2002) (10/12/2002) Withdrawn
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
Available languages: English
Available design: Online Secure PDF
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ASTM F1262M-95(2008) (15/06/2008) Withdrawn
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
Available languages: English
Available design: Online Secure PDF
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ASTM F1263-11 (01/06/2011) Withdrawn
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Available languages: English
Available design: Online Secure PDF
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ASTM F1263-11(2019) (01/12/2019) Withdrawn
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Available languages: English
Available design: Online Secure PDF
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ASTM F1263-99 (10/12/1999) Withdrawn
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Available languages: English
Available design: Online Secure PDF
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ASTM F1263-99(2005) (10/12/1999) Withdrawn
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Available languages: English
Available design: Online Secure PDF
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ASTM F1264-00 (10/12/2001) Withdrawn
Standard Specification and Test Methods for Intramedullary Fixation Devices
Available languages: English
Available design: Online Secure PDF
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ASTM F1264-01 (10/12/2001) Withdrawn
Standard Specification and Test Methods for Intramedullary Fixation Devices
Available languages: English
Available design: Online Secure PDF
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ASTM F1264-03 (10/04/2003) Withdrawn
Standard Specification and Test Methods for Intramedullary Fixation Devices
Available languages: English
Available design: Online Secure PDF
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ASTM F1264-03(2007) (01/10/2007) Withdrawn
Standard Specification and Test Methods for Intramedullary Fixation Devices
Available languages: English
Available design: Online Secure PDF
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