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ASTM - American technical standards
Page 8101
ASTM F1259M-96 (01/01/1996) Withdrawn
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]
Available languages: English
Available design: Online Secure PDF
from 69.70 EUR more info
ASTM F1259M-96(2003) (10/06/1996) Withdrawn
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009)
Available languages: English
Available design: Online Secure PDF
from 69.70 EUR more info
ASTM F126 Withdrawn
Definitions of Terms Relating to Which Relate to the Use and Testing of Ferrite Memory Cores and Memory Core Arrays (Withdrawn 1976)
Available languages: English
Available design: Online Secure PDF, Standard + Redline - Online secure PDF
ASTM F1260-89 (01/01/1989) Withdrawn
Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations
Available languages: English
Available design: Online Secure PDF
from 77.80 EUR more info
ASTM F1260M-96 (01/01/1996) Withdrawn
Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
Available languages: English
Available design: Online Secure PDF
from 77.80 EUR more info
ASTM F1260M-96(2003) (10/06/1996) Withdrawn
Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)
Available languages: English
Available design: Online Secure PDF
from 77.80 EUR more info
ASTM F1261M-96 (01/01/1996) Withdrawn
Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
Available languages: English
Available design: Online Secure PDF
from 69.70 EUR more info
ASTM F1261M-96(2003) (10/06/1996) Withdrawn
Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009)
Available languages: English
Available design: Online Secure PDF
from 69.70 EUR more info
ASTM F1262M-14 (01/06/2014) Withdrawn
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
Available languages: English
Available design: Online Secure PDF
from 77.80 EUR more info
ASTM F1262M-95 (10/11/1995) Withdrawn
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
Available languages: English
Available design: Online Secure PDF
from 77.80 EUR more info
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