Withdrawn | Published: 15/06/2008

ASTM F1262M-95(2008) Withdrawn

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

Available languages: English

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Detail information

Designation: ASTM F1262M-95(2008)

Publication date: 15/06/2008

Pages: 5

Note: Withdrawn

Country: American technical standard

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Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, Combinational logic, Destructive testing--semiconductors, Digital integrated circuits, Electrical conductors (semiconductors), Failure end point--electronic components/devices, 0Functional errors, Integrated circuits, Ionizing radiation, Irradiance/irradiation--semiconductors, 0Microelectronic devices, MSI integrated circuits, Output transient voltage

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