GB - Chinese national standards

300mm polished monocrystalline silicon wafers

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Test method for measuring flatness, thickness and total thickness variation on silicon wafers by automated non-contact scanning

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300mm monocrystalline silicon as cut slices and grinded slices

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Methods for chemical analysis of gold-loaded carbon—Part 1: Determination of gold and silver contents

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Methods for chemical analysis of gold-loaded carbon - Part 2Determination of silver content - Flame atomic absorption spectrometry

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Common test methods for insulating and sheathing materials of electric and optical cables - Part 11Methods for general application - Measurement of thickness and overall dimensions - Tests for determining the mechanical properties

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Common test methods for insulating and sheathing materials of electric and optical cables - Part 12:Methods for general application - Thermal ageing methods

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Common test methods for insulating and sheathing materials of electric and optical cables - Part 13:Methods for general application - Measurement for determining the density - Water absorption tests - Shrinkage test

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Common test methods for insulating and sheathing materials of electric and optical cables - Part 14:Methods for general application - Test at low temperature

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Common test methods for insulating and sheathing materials of electric and optical cables - Part 21:Methods specific to elastomeric compounds - Ozone resistance, hot set and mineral oil immersion tests

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