GB - Chinese national standards

Semiconductor devices—Bias-temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs)—Part 1: Fast bias-temperature instability test for MOSFETs

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Information technology—Software measurement—Software quality measurement—Automated source code quality measures

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Semiconductor devices—Stress migration test—Part 1: Copper stress migration test

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Semiconductor devices—Constant current electromigration test

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Test method for printed board—Monitoring of single plated-through hole(PTH) resistance change during temperature cycling

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Design methods for satellite-earth data transmission link of remote sensing satellites

Available languages: English, Chinese

Available design: electronic design (pdf), Print design

Visible to short-wave infrared spectral reflectance measurement of crops

Available languages: English, Chinese

Available design: electronic design (pdf), Print design