GB - Chinese national standards

Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge

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Semiconductor devices—Mechanical and climatic test methods—Part 41Test method for reliability of non-volatile memory devices

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Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage

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Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

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Semiconductor devices—Mechanical and climatic test methods—Part 8Sealing

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Semiconductor devices—Mechanical and climatic test methods—Part 9Permanence of marking

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Asphalt used in roofing

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Degrees of protection provided by the integral design of rotating electrical machines (IP code)—Classification

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Audio/video,information and communication technology equipment—Part 1: Safety requirements

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Audio/video, information and communication technology equipment—Part 2: Explanatory information related to GB 4943.1—2022

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