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Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Available design: Print design
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Available design: Print design
Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Available languages: English
Available design: Print design
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
Available languages: English (the title page in Czech only)
Available design: Print design
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
Available languages: English (the title page in Czech only)
Available design: Print design
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Available design: Print design
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Available design: Print design
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
Available design: Print design
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
Available design: Print design