IEC - International electro-technical commission

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 35: Microscopie acoustique pour composants electroniques a boitier plastique)

Available languages: English and French

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Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 36: Acceleration constante)

Available languages: Spanish, English and French

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Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 37: Methode d´essai de chute au niveau de la carte avec utilisation d´un accelerometre)

Available languages: English and French

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Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 38: Methode d´essai des erreurs logicielles pour les dispositifs a semiconducteurs avec memoire)

Available languages: English and French

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Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 39: Mesure de la diffusivite d´humidite et de l´hydrosolubilite dans les materiaux organiques utilises dans les composants a semiconducteurs)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Available languages: English

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 4: Essai continu fortement accelere de contrainte de chaleur humide (HAST))

Available languages: English, English and French

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Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
(Dispositifs a semiconducteurs - Methodes d´essais climatiques et mecaniques - Partie 40: Methode d´essai de chute au niveau de la carte avec utilisation d´une jauge de contrainte)

Available languages: English and French

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Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 41: Methodes d’essai normalisees pour la fiabilite des dispositifs a memoire non volatile)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM