STN - Slovak standards

Transistors. Methods for measurement of switching times

Available design: Print design

Bipolar transistors. Pulse method of collector-emitter breakdown voltage measurement

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Long duration storage of electronic components – Specification for implementation

Available languages: English

Available design: Print design

Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data

Available languages: English

Available design: Print design

Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage

Available languages: English

Available design: Print design

Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

Available languages: English

Available design: Print design

Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices

Available languages: English

Available design: Print design

Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices

Available languages: English

Available design: Print design

Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices

Available languages: English

Available design: Print design

Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases

Available languages: English

Available design: Print design