STN - Slovak standards

Transistors. Measuring method of collector-base and emitter-base breakdown voltage

Available design: Print design

Transistors. Measuring method of common-emitter small-signal short- circuit forward current transfer ratio

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Transistors. Method of noise figure measuring

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Transistors. Methods of measuring collector cut-off current, emitter cut-off current and collector-emitter cut-off current

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Transistors. Methods of measuring collector and emitter barrier layer capacitance

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Transistors. Measuring method of static value of the common-emitter forward current transfer ratio

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Transistors. Measuring method of absolute value of forward current transfer ratio and transition frequency

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Transistors. Measuring methods of base-emitter voltage

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Transistors. Methods for measurement of thermal resistance

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Transistors. Methods for measurement of output capacity in common base connection

Available design: Print design