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STN - Slovak standards
Page 2975
STN 358761 (01/03/1973) Withdrawn
Semiconductor devices. Phototransistors - photodiodes. Measurement of photoelectric current
Available design: Print design
STN 358762 (01/03/1973) Withdrawn
Semiconductor devices. Phototransistors - photodiodes. Measurement of dark current
Available design: Print design
STN 358763 (01/03/1973) Withdrawn
Semiconductor devices. Diodes. Measurement of reverse breakdown voltage
Available design: Print design
STN EN 163100 (01/05/2015)
Sectional Specification: Film and hybrid integrated circuits
Available languages: English
Available design: Print design
STN EN 163101 (01/05/2015)
Blank Detail Specification: Film and hybrid integrated circuits
Available languages: English
Available design: Print design
STN EN 165000-1 (01/11/2000)
Film and hybrid integrated circuits. Part 1: Generic specification: Capability approval procedure
Available languages: English
Available design: Print design
STN EN 165000-2 (01/11/2000)
Film and hybrid integrated circuits. Part 2: Internal visual inspection and special tests
Available languages: English
Available design: Print design
STN EN 165000-3 (01/11/2000)
Film and hybrid integrated circuits. Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
Available languages: English
Available design: Print design
STN EN 165000-4 (01/11/2000)
Film and hybrid integrated circuits. Part 4: Customer information, product assessment level schedules and blank detail specification
Available languages: English
Available design: Print design
STN EN 165000-5 (01/11/2000)
Film and hybrid integrated circuits. Part 5: Procedure for qualification approval
Available languages: English
Available design: Print design
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