STN - Slovak standards

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

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Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 7: Meranie obsahu vnútornej vlhkosti a analýza ostatných zvyškových plynov (Norma na priame používanie ako STN). (Platnosť do 31.1.2029).

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Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

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Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing

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Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly

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Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method

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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

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Semiconductor devices - Mechanical and climatic test methods Part 14: Robustness of terminations (lead integrity)

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