STN - Slovak standards

Integrated circuits. Memory devices pin configurations

Available languages: English

Available design: Print design

Semiconductor devices. Integrated circuits. Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

Available languages: Czech

Available design: Print design

Polovodičové súčiastky. Integrované obvody. Časť 20: Kmeňová norma pre vrstvové integrované obvody a hybridné integrované obvody.

Available languages: Slovak

Available design: Print design

Semiconductor devices. Integrated circuits. Part 1: General

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Semiconductor devices - Mechanical and climatic test methods -- Part 1: General

Available languages: English

Available design: Print design

Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure

Available languages: English

Available design: Print design

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

Available languages: English

Available design: Print design

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Available languages: English

Available design: Print design

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Available languages: English

Available design: Print design

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Available languages: English

Available design: Print design