STN - Slovak standards

Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 26: Skúšanie citlivosti na elektrostatický výboj (ESD). Model ľudského tela (HBM) (Norma na priame používanie ako STN). (Platnosť do 19.2.2021).

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Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

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Semiconductor devices – Mechanical and climatic test methods Part 29: Latch-up test

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Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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Halbleiterbauelemente – Mechanische und klimatische Prüfverfahren Teil 34: Lastwechselprüfung

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Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

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Semiconductor devices - Mechanical and climatic test methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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Semiconductor devices for widely used equipment. General specifications. Methods of tests

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Integrated circuits for widely used equipment. General specifications. Methods of tests

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