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UNE - Spanish national standards
Page 3033
UNE-EN 60749-21:2011 (01/11/2011)
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Available languages: English
Available design: electronic design (pdf), Print design
from 1 678.30 CZK more info
UNE-EN IEC 60749-21:2026 (01/03/2026)
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by Asociación Espanola de Normalización in March of 2026.)
Available languages: English
Available design: electronic design (pdf), Print design
from 1 727.20 CZK more info
UNE-EN IEC 60749-22-1:2026 (01/02/2026)
Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods (Endorsed by Asociación Espanola de Normalización in February of 2026.)
Available languages: English
Available design: electronic design (pdf), Print design
from 2 828.20 CZK more info
UNE-EN IEC 60749-22-2:2026 (01/02/2026)
Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods (Endorsed by Asociación Espanola de Normalización in February of 2026.)
Available languages: English
Available design: electronic design (pdf), Print design
from 2 086.90 CZK more info
UNE-EN 60749-22:2004 (26/03/2004)
Semiconductor devices - Mechanical and climatic test methods -- Part 22: Bond strength
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 1 653.80 CZK more info
UNE-EN 60749-23:2005 (16/03/2005)
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 1 223.30 CZK more info
UNE-EN 60749-23:2005/A1:2011 (21/12/2011) Change
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 768.20 CZK more info
UNE-EN IEC 60749-23:2026 (01/03/2026)
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (Endorsed by Asociación Espanola de Normalización in March of 2026.)
Available languages: English
Available design: electronic design (pdf), Print design
from 1 343.10 CZK more info
UNE-EN 60749-24:2005 (16/03/2005)
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 1 149.90 CZK more info
UNE-EN IEC 60749-24:2026 (01/02/2026)
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased hast (Endorsed by Asociación Espanola de Normalización in February of 2026.)
Available languages: English
Available design: electronic design (pdf), Print design
from 1 343.10 CZK more info
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