Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
UNE - Spanish national standards
Page 3035
UNE-EN 60749-32:2004 (18/03/2004)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 35.30 EUR more info
UNE-EN 60749-32:2004/A1:2011 (19/01/2011) Change
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 35.30 EUR more info
UNE-EN 60749-33:2005 (16/03/2005)
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 40.20 EUR more info
UNE-EN IEC 60749-34-1:2025 (01/09/2025)
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (Endorsed by Asociación Espanola de Normalización in September of 2025.)
Available languages: English
Available design: electronic design (pdf), Print design
from 77.40 EUR more info
UNE-EN 60749-34:2011 (20/07/2011)
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 59.80 EUR more info
UNE-EN 60749-35:2006 (01/01/2007)
Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
Available languages: English
Available design: electronic design (pdf), Print design
from 68.60 EUR more info
UNE-EN 60749-36:2004 (18/03/2004)
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Available languages: English, Spanish
Available design: electronic design (pdf), Print design
from 35.30 EUR more info
UNE-EN IEC 60749-37:2022 (01/01/2023)
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Espanola de Normalización in January of 2023.)
Available languages: English
Available design: electronic design (pdf), Print design
from 71.50 EUR more info
UNE-EN 60749-38:2008 (01/09/2008)
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
Available languages: English
Available design: electronic design (pdf), Print design
from 57.80 EUR more info
UNE-EN IEC 60749-39:2022 (01/03/2022)
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (Endorsed by Asociación Espanola de Normalización in March of 2022.)
Available languages: English
Available design: electronic design (pdf), Print design
from 64.70 EUR more info
Copyright © All rights reserved | This template is made with by Colorlib
