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Active standard | Published: 01/10/2024
ASTM E1127-24
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Available languages: English
Available design: Online Secure PDF, Print design
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Detail information
Designation: ASTM E1127-24
Publication date: 01/10/2024
Pages: 6
Country: American technical standard
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You can buy at www.mystandards.bizAnotation
Keywords:angle lapping, angle-resolved AES, Auger electron spectroscopy, ball cratering, compositional depth profiling, cross sectioning, depth profiling, depth resolution, sputter depth profiling, sputtering, thin films,
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