Withdrawn | Published: 10/06/2000

ASTM E1250-88(2000) Withdrawn

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

Available languages: English

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Detail information

Designation: ASTM E1250-88(2000)

Publication date: 10/06/2000

Pages: 10

Note: Withdrawn

Country: American technical standard

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Keywords:
Cobalt-60 irradiators, Electrical conductors-semiconductors, Electronic hardness, Electronic materials/applications, Gamma radiation, Hardness tests-radiation (of semiconductors), Ionizing radiation, Irradiance/irradiation, Low-energy gamma radiation, Photon energy spectrum, Radiation exposure-nuclear materials/applications, Radiation-hardness testing, Silicon-semiconductor applications, ionization chambers to assess the low energy gamma component of

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