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Withdrawn | Published: 01/06/2009
ASTM E1426-98(2009)e1 Withdrawn
Standard Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress (Includes all amendments And changes 2/27/2015).
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM E1426-98(2009)e1
Publication date: 01/06/2009
Pages: 5
Note: Withdrawn
Country: American technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Keywords:elastic parameter, residual stress, x-ray diffraction, Crystal lattice structure, Effective elastic parameter (Eeff), Macroscopic analysis, Polycrystalline materials, Residual stress, Stress--metallic materials, X-ray diffraction analysis, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
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